{"id":80870,"date":"2025-08-13T06:04:28","date_gmt":"2025-08-13T06:04:28","guid":{"rendered":"https:\/\/electronicsmaker.com\/?p=80870"},"modified":"2025-08-13T06:04:31","modified_gmt":"2025-08-13T06:04:31","slug":"accelerating-high-speed-network-test-from-lab-to-field","status":"publish","type":"post","link":"https:\/\/electronicsmaker.com\/accelerating-high-speed-network-test-from-lab-to-field","title":{"rendered":"Accelerating High-Speed Network Test from Lab to Field"},"content":{"rendered":"
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Shashikanth MC, Director-Sales, Lab & Production, VIAVI<\/em><\/figcaption><\/figure><\/div>\n\n\n

Emerging applications like AI, ML, high-performance computing (HPC), virtualization and quantum computing are driving bandwidth and scale at an accelerating rate, creating increasingly difficult challenges for manufacturers of chips, pluggables and network equipment\u2019s.\u00a0 The need for high data rates in data centers, essential for providing low-latency and high-throughput services, IoT, rapid expansion of cloud services, AI-driven infrastructure and many such applications are pushing higher optical networks to 1.6Tb\/s and beyond.<\/p>\n\n\n\n

To address this, architects and developers need modern, sophisticated instrumentation to test at these higher speeds while maintaining accuracy, deployment and testing efficiency, and overall cost effectiveness. As AI networks continue to fuel ethernet demand, advanced, next-gen testing platform designed for challenges of speed and scale is essential for testing RoCEv2 (RMDA over Converged Ethernet networks v2) traffic and validate the performance and reliability of AI network fabrics.<\/p>\n\n\n

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Perfect for high-speed module suppliers, ICPs, NEMs and service providers who work on high-speed Ethernet projects, ONE LabPro ONE-1600 supports manufacturers of Integrated Circuits (ICs), transceivers, and switching systems operating up to 1.6Tb\/s with R&D, System Verification Testing (SVT), and live production and manufacturing testing.<\/strong><\/p>\n\n\n\n

The ONE LabPro ONE-1600 provides a highly advanced test platform for physical layer silicon fully aligned with emerging standards, the ability to test framed and unframed traffic, and enables support for high-bandwidth network switching devices at the heart of Ethernet fabric for AI at scale. Featuring the highest levels of port density and scalability in the market, ONE LabPro scales to 102Tb\/s of test bandwidth such as 64 x 1.6Tb\/s test ports using ONE-1600 modules or 128 x 800Gb\/s test ports using HSE-800 modules, orchestrated by a single controller. The system can synchronize to sub-nanosecond mixed combinations of test modules, centrally managed by the controller, with full breakout capabilities, multi-user logical port support, and single-user per logical port granularity. With a contemporary, web-based user interface and next-generation, python-based automation framework, ONE LabPro enables advanced traffic generation and analysis to troubleshoot and test the functionality and performance of ICs, pluggable interfaces, switching and routing devices, and networks. VIAVI continues to advance state-of-the-art technology for testing next-generation network components to not only enable products to be delivered to market faster, but also to ensure peak performance throughout the network lifecycle.<\/p>\n","protected":false},"excerpt":{"rendered":"

Emerging applications like AI, ML, high-performance computing (HPC), virtualization and quantum computing are driving bandwidth and scale at an accelerating rate, creating increasingly difficult challenges for manufacturers of chips, pluggables and network equipment\u2019s.\u00a0 The need for high data rates in data centers, essential for providing low-latency and high-throughput services, IoT, rapid expansion of cloud services, […]<\/p>\n","protected":false},"author":2,"featured_media":80872,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[14],"tags":[5645,99],"yoast_head":"\nAccelerating High-Speed Network Test from Lab to Field - Electronics Maker<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/electronicsmaker.com\/accelerating-high-speed-network-test-from-lab-to-field\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"Accelerating High-Speed Network Test from Lab to Field - 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