{"id":80809,"date":"2025-07-25T09:14:51","date_gmt":"2025-07-25T09:14:51","guid":{"rendered":"https:\/\/electronicsmaker.com\/?p=80809"},"modified":"2025-07-25T09:14:52","modified_gmt":"2025-07-25T09:14:52","slug":"ieee-international-test-conference-india-2025-accelerates-innovation-in-semiconductor-testing-and-validation","status":"publish","type":"post","link":"https:\/\/electronicsmaker.com\/ieee-international-test-conference-india-2025-accelerates-innovation-in-semiconductor-testing-and-validation","title":{"rendered":"IEEE International Test Conference India 2025 Accelerates Innovation in Semiconductor Testing and Validation!"},"content":{"rendered":"
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Bengaluru, India | July 23, 2025<\/strong> \u2014 The 9th IEEE International Test Conference India (ITC India 2025) concluded on a high note in Bengaluru, held between 20th and 22nd July, reaffirming its role as a strategic platform to advance India\u2019s growing presence in the global semiconductor ecosystem.<\/p>\n\n\n\n

Bringing together hundreds of professionals from across industry and academia, this year\u2019s edition spotlighted the latest breakthroughs in semiconductor test, validation, simulation, and system-level reliability. With a diverse lineup of global speakers, parallel technical tracks, panel discussions, and live technology showcases, the event served as a crucial bridge between research, application, and industry demand.<\/p>\n\n\n\n

Supported by leading technology companies including Caliber Interconnects, Siemens, Tessolve, Google, Cadence, Synopsys, Qualcomm, DeFT, Soliton, Anora, Mirafra, Advantest, and Maven Silicon, the conference created a dynamic environment for learning, networking, and collaboration. Exhibitors demonstrated a wide array of products and solutions spanning AI-enabled test automation, advanced DFT methodologies, post-silicon validation tools, yield optimization, and system reliability platforms.<\/p>\n\n\n\n

Organized with the technical backing of IEEE Bangalore Section, along with IESA, VLSI Society, and other strategic partners, the event saw increased participation and positive feedback, with attendees noting stronger footfall, richer content, and valuable peer engagement compared to previous editions.<\/p>\n\n\n\n

One of the most impactful moments of the event was the final day keynote by Mr. Suresh Babu K, Managing Director, Caliber Interconnect Solutions, titled \u201cFrom Silicon to Solutions: The Societal Impact of Semiconductor Leadership.\u201d His address mapped out the future of the semiconductor industry by highlighting:<\/p>\n\n\n\n

\u2022\u00a0 The Global Semiconductor Mission and India’s rising role<\/strong><\/p>\n\n\n\n

\u2022\u00a0 Time-to-market acceleration and quality assurance as competitive levers<\/strong><\/p>\n\n\n\n

\u2022\u00a0 Challenges in test scalability<\/strong><\/p>\n\n\n\n

\u2022\u00a0 The evolution of test\u2014from design to validation<\/strong><\/p>\n\n\n\n

\u2022\u00a0 Strategic priorities and ecosystem collaboration to fuel innovation and self-reliance<\/strong><\/p>\n\n\n\n

He emphasized that India\u2019s engineering services companies must adapt continuously to technology shifts across end-product lifecycles, and pointed to the significant job opportunities emerging in this evolving test ecosystem.<\/p>\n\n\n\n

\u201cOur readiness to provide design-to-validation solutions will define India\u2019s contribution to the global semiconductor value chain,\u201d said Mr. Suresh Babu, urging greater collaboration among industry stakeholders, startups, and academia.<\/p>\n\n\n\n

Global Thought Leaders at the Forefront of Innovation. Other notable keynotes that enriched the conference included<\/p>\n\n\n\n

\u2022\u00a0 \u201cThe Right Testing Strategy Can Save Designs\u201d<\/strong> by Nitza Basoco, Teradyne<\/p>\n\n\n\n

\u2022\u00a0 \u201cRethinking Silicon Test to Reduce DPPM and SDC\u201d<\/strong> by Dr. Sreejit Chakravarty, IEEE Fellow & Distinguished Engineer, Ampere Computing (USA)<\/p>\n\n\n\n

\u2022\u00a0 \u201cTransformative Design-for-Test Technologies for Silicon Lifecycle Management\u201d<\/strong> by Janusz Rajski, Siemens EDA<\/p>\n\n\n\n

\u2022\u00a0 \u201cThe Future of AI Hardware Enabled by Advanced Packaging\u201d<\/strong> by Raja Swaminathan, AMD (USA)<\/p>\n\n\n\n

\u2022\u00a0 \u201cEnabling Efficient Prototyping for Fabless Design Houses\u201d<\/strong> by Rajesh V, Senior VP \u2013 Test & Product Engineering, Tessolve (India)<\/p>\n\n\n\n

These sessions underscored the critical role of innovation in reducing test escape rates, improving yield predictability, and ensuring robustness in next-generation chips, especially as AI, edge computing, and automotive electronics demand more complex test coverage.<\/p>\n\n\n\n

Strengthening India\u2019s Semiconductor Future<\/p>\n\n\n\n

The conference fostered cross-disciplinary conversations around:<\/p>\n\n\n\n

\u2022\u00a0 AI\/ML in test analytics<\/strong><\/p>\n\n\n\n

\u2022\u00a0 Secure test infrastructures for hardware IP<\/strong><\/p>\n\n\n\n

\u2022\u00a0 EDA-cloud synergy for scalable simulation<\/strong><\/p>\n\n\n\n

\u2022\u00a0 Prototyping efficiency for fabless startups<\/strong><\/p>\n\n\n\n

As India makes bold strides toward becoming a global semiconductor hub, IEEE ITC India 2025 has once again proven to be a vital ecosystem enabler \u2014 connecting visionaries, technologists, and innovators who are defining the future of silicon reliability and performance.<\/p>\n\n\n\n

Saravanam J<\/p>\n\n\n\n

9880974765<\/p>\n","protected":false},"excerpt":{"rendered":"

Bengaluru, India | July 23, 2025 \u2014 The 9th IEEE International Test Conference India (ITC India 2025) concluded on a high note in Bengaluru, held between 20th and 22nd July, reaffirming its role as a strategic platform to advance India\u2019s growing presence in the global semiconductor ecosystem. Bringing together hundreds of professionals from across industry […]<\/p>\n","protected":false},"author":2,"featured_media":80810,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"footnotes":""},"categories":[1],"tags":[],"yoast_head":"\nIEEE International Test Conference India 2025 Accelerates Innovation in Semiconductor Testing and Validation! - Electronics Maker<\/title>\n<meta name=\"robots\" content=\"index, follow, max-snippet:-1, max-image-preview:large, max-video-preview:-1\" \/>\n<link rel=\"canonical\" href=\"https:\/\/electronicsmaker.com\/ieee-international-test-conference-india-2025-accelerates-innovation-in-semiconductor-testing-and-validation\" \/>\n<meta property=\"og:locale\" content=\"en_US\" \/>\n<meta property=\"og:type\" content=\"article\" \/>\n<meta property=\"og:title\" content=\"IEEE International Test Conference India 2025 Accelerates Innovation in Semiconductor Testing and Validation! - Electronics Maker\" \/>\n<meta property=\"og:description\" content=\"Bengaluru, India | July 23, 2025 \u2014 The 9th IEEE International Test Conference India (ITC India 2025) concluded on a high note in Bengaluru, held between 20th and 22nd July, reaffirming its role as a strategic platform to advance India\u2019s growing presence in the global semiconductor ecosystem. 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